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TITLE: Data-driven spectral analysis for nanomaterial information embed in the secondary electron background DATE: 9.00am, July 20, 2018. SPEAKER: Dr. Bo DA ADDRESS: The 314 meeting room of North Building ABSTRACT: In most spectroscopic data analyses, the background signal is regarded as noise and only signal data are analyzed. However, such background signal may reflect various background processes and hold some useful information for comprehensive materials characterization. The main reason of such a situation is due to the widely used physics-driven analysis method in which the analysis is based on the modeling of the individual physical mechanism. Herein, we present a new heuristic data-driven analysis method to extract meaningful information from the background signal and to propose an important breakthrough for the next generation surface analysis. The basic idea of the proposal is to use not only physically-defined descriptors but also analytically-defined ones obtained through the data analysis of many slightly different conditions. Interestingly, the inspiration of this idea comes from the design idea of intermediate band solar cells. |
